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2Pawel Pohl, Nopparat Vorapalawut, Brice Bouyssiere and Ryszard Lobinski.
Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS, J. Anal. Atom. Spectrosc., 2010, 25, 1461. Raquel Sánchez, José-Luis Todolí, Charles-Philippe Lienemann and Jean-Michel Mermet.
Effect of the silicon chemical form on the emission intensity in inductively coupled plasma atomic emission spectrometry for xylene matrices, J. Anal. Atom. Spectrosc., 2009, 24, 391.